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Innovative Nanotech Inc.

Hsinchu,  Taiwan
http://www.i-nanotech.com
  • Booth: 5756

Overview

I-Nanotech: Epoch-making Monitor for Nanoparticles and Impurities

SuperSizer Series

I-Nanotech is a startup company which manufactures a new generation monitor for nanoparticles and impurituies in wet chemicals. Our product, SuperSizer Series, is the only tool in the market that can detect nanoparticles and impurituies under 20nm, down to 3nm. Therefore, we have advantage over other conventional monitors. Currently, we have 4 models available to test liquid chemicals including slurries, IPA, H2O2 , UPW and Ammonia. SuperSizer V for IPA measurement is our main product. Each model has Semi S2 certification. Meanwhile, SuperSizer V for IPA measurement has Zone 2 explosion-proof certification, and cope with criterion from Taiwan, North America, and International Electrotechnical Commission. We are now proactively expanding our business to the global market. Look forward to your partucipation.


  Products

  • SuperSizer V
    Applilication: In-line measurement for IPA Measuring: 3-64nm Certification: Semi S2/TS Explosion/ETL certification/IEC certification LxWxH: 788x915x2043 mm Weight: 350 kg...

  • Current technology (Light Scattering Method) can only count the particles above 20 nm size. However, there can be lots of killer particles below this limitation, which cannot be detected. Thus, the particles and impurities under 20 nm size have become a big concern in sub-10 nm advance technology notes. SuperSizer breaks the limits and successfully "sees" the particles and impurities between 3-20 nm size. As a result, SuperSizer has become a powerful yield enhancer.
  • SuperSizer VI
    Applilication: In-line measurement for H2O2/UPW Measuring: 3-64 nm Certification: Semi S2 LxWxH: 809x1000x2068 mm Weight: 350 kg...

  • Current technology (Light Scattering Method) can only count the particles above 20 nm size. However, there can be lots of killer particles below this limitation, which cannot be detected. Thus, the particles and impurities under 20 nm size have become a big concern in sub-10 nm advance technology notes. SuperSizer breaks the limits and successfully "sees" the particles and impurities between 3-20 nm size. As a result, SuperSizer has become a powerful yield enhancer.
  • SuperSizer II
    SuperSizer II Applilication: In-line measurement for Slurry Measuring: 3-64 nm Certification: Semi S2 LxWxH: 809x1300x1800 mm Weight: 400 kg...

  • Current technology (Light Scattering Method) can only count the particles above 20 nm size. However, there can be lots of killer particles below this limitation, which cannot be detected. Thus, the particles and impurities under 20 nm size have become a big concern in sub-10 nm advance technology notes. SuperSizer breaks the limits and successfully "sees" the particles and impurities between 3-20 nm size. As a result, SuperSizer has become a powerful yield enhancer.

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